Search for tag: "defects"
Microscopic Imaging AnalysisMonolayer molybdenum disulfide is a unique semiconductor that can be utilized for microelectronics and optoelectronic devices. However the quality of these devices highly depends on the quality…
From James McGlade
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Defects Detection and Classification on Metallic SurfacesInspecting metallic parts is a challenging task and is in demand in various manufacturing quality control applications. Computer Visions (CV), Machine Learning (ML) and Deep Learning (DL) are…
From James McGlade
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