Monolayer molybdenum disulfide is a unique semiconductor that can be
utilized for microelectronics and optoelectronic devices. However the
quality of these devices highly depends on the quality and defect
morphology of these layers. This project utilizes computer vision to
detect the defects and perform analysis on molybdenum sulfide images
with varying levels of proton irradiation energy.
Student Author: Holly Schafer
Faculty Advisor: Vinayak Elangovan